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  1. Equipment Technology Conveyance Homepage

    A Manufacturer's Representative for Equipment and Materials sold for Semiconductor Fabrication, Assembly and Packaging.
    wire2
    masks2
    microscope2
    bar code2
    microscopes2
    cassettes1
    semiconductor equipment1
    pick and place1
    visual inspection1
    vespel1
    lead frame1
    die bonder1
    lead frames1
    die bonders1
    wafer mapping1
    UV tape1
    wafer mounter1
    ball grid arrays1
    post bond1
    linewidth measurement1
    CD measurement1
    cleanroom cabinets1
    critical dimension measurement1
    die coat1
    die sorter1
    die sorters1
    die demounters0
    die taping0
    disposable cleanroom supplies0
    wafer mounters0

    www.etcsales.com - 2009-02-05

  2. MueTec

    MueTec is long-term successfully cooperating with Semiconductor global main-players, manufacturers of micro mechanic components and High Tech companies ...
    contact3
    Mask2
    Microscope2
    Metrology2
    Wafer1
    Overlay1
    serif1
    DUV1
    linewidth1
    I-line1
    corner rounding1
    positioning stage1
    90nm1
    248nm1
    365nm1
    linewidth measurement1
    CD measurement1
    scanning stage1
    90nm technology node0
    CD metrology0
    DUV illumination0
    Incoming mask inspection0
    line edge roughness0
    line end shortening0
    linewidth metrology0
    overlay measurement0
    overlay metrology0
    registration measurement0
    stepper like illumination0
    TIS calibration0
    WIS detection0

    www.muetec.com - 2009-02-05

  3. John P Kummer - Semiconductor tools and materials

    The John P Kummer group supplies test, metrology, inspection and reliability & failure analysis tools and equipment to the European semiconductor industry.
    marketing6
    sales5
    inspection3
    measurement2
    handling2
    semiconductor2
    calibration2
    reliability2
    geometry2
    metrology2
    wafer1
    overlay1
    sorting1
    analyzers1
    flow switches1
    characterisation1
    probe cards1
    ion sources1
    decapsulation1
    thin film characterisation1
    ion-assisted deposition1
    linewidth measurement1
    electromigration testing0
    hot carrier degradation0
    load board testing0
    probe card analysis0
    probe card testing0
    standards package0
    tddb c-v measeurements0
    wafer edge inspection0
    water flow sensing0

    www.jpkummer.com - 2009-02-06

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